Method for setting parameters of a vision detector using...

Image analysis – Applications

Reexamination Certificate

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C382S103000, C382S104000, C382S107000, C382S101000, C382S141000, C382S143000, C382S162000, C348S211990

Reexamination Certificate

active

07545949

ABSTRACT:
Disclosed are systems and methods for setting various operating parameters of a vision detector from production line information that can be supplied by a manufacturing technician who is not skilled in the art of the invention. These operating parameters include shutter time, video gain, idle time, frame count, and locator search range. The production line information includes line speed, field of view size, direction of motion, and object spacing.

REFERENCES:
patent: 5164998 (1992-11-01), Reinsch
patent: 5184217 (1993-02-01), Doering
patent: 5481712 (1996-01-01), Silver et al.
patent: 5717834 (1998-02-01), Werblin et al.
patent: 5734742 (1998-03-01), Asaeda
patent: 5802220 (1998-09-01), Black et al.
patent: 5943432 (1999-08-01), Gilmore et al.
patent: 5960097 (1999-09-01), Pfeiffer et al.
patent: 6046764 (2000-04-01), Kirby et al.
patent: 6049619 (2000-04-01), Anandan et al.
patent: 6072494 (2000-06-01), Nguyen
patent: 6072882 (2000-06-01), White et al.
patent: 6173070 (2001-01-01), Michael et al.
patent: 6175644 (2001-01-01), Scola et al.
patent: 6184924 (2001-02-01), Schneider et al.
patent: 6282462 (2001-08-01), Hopkins
patent: 6285787 (2001-09-01), Kawachi et al.
patent: 6346966 (2002-02-01), Toh
patent: 6396949 (2002-05-01), Nichani
patent: 6487304 (2002-11-01), Szeliski
patent: 6525810 (2003-02-01), Kipman
patent: 6526156 (2003-02-01), Black et al.
patent: 6539107 (2003-03-01), Michael et al.
patent: 6549647 (2003-04-01), Skunes et al.
patent: 6597381 (2003-07-01), Eskridge et al.
patent: 6628805 (2003-09-01), Hansen et al.
patent: 6741977 (2004-05-01), Nagaya et al.
patent: 6987528 (2006-01-01), Nagahisa et al.
patent: 7088387 (2006-08-01), Freeman et al.
patent: 2002/0005895 (2002-01-01), Freeman et al.
patent: 2002/0177918 (2002-11-01), Pierel et al.
patent: 2002/0196342 (2002-12-01), Walker et al.
patent: 2003/0113018 (2003-06-01), Nefian et al.
patent: 2003/0137590 (2003-07-01), Barnes et al.
patent: 2004/0148057 (2004-07-01), Breed et al.
patent: 2004/0218806 (2004-11-01), Miyamoto et al.
patent: 2006/0146377 (2006-07-01), Marshall et al.
patent: 2006/0223628 (2006-10-01), Walker et al.
patent: 2007/0009152 (2007-01-01), Kanda
patent: 2008/0166015 (2008-07-01), Haering et al.
patent: 0815688 (2000-05-01), None
patent: 0815688 (2000-05-01), None
patent: WO 96/09597 (1996-03-01), None
Chen, Y. H., “Computer Vision for General Purpose Visual Inspection: a Fuzzy Logic Approach”,Optics and Lasers in Engineering 22, Elsevier Science Limited, vol. 22, No. 3,(1995),pp. 182-192.
Di Mauro, E. C., et al., “Check—a generic and specific industrial inspection tool”,IEE Proc.-Vis. Image Signal Process., vol. 143, No. 4,(Aug. 27, 1996),pp. 241-249.
National Instruments, “IMAQVision Builder Tutorial”,IMAQXP-002356530, http://www.ni.com/pdf/manuals/322228c.pdf,(Dec. 2000).
“CCD/CMOS Sensors Spot Niche Application”,PennWell Corporation, Vision System Design—Imaging and Machine Vision Technology,(2004).
“iQ 180”,Adaptive Optics Associates900 Coles Road Blackwood, NJ 08012-4683, (Dec. 2003).
“Laser Scanning Product Guide”,Adaptive Optics Associates—Industrial Products and Systems90 Coles Road Blackwood, NJ 08012, Industrial Holographic and Conventional Laser 1D, Omnidirectional Bar Codes Scanners,(Mar. 2003).
“Matsushita Imagecheckers”,NAiS Machine Vision—Matsushita Machine Vision Systems, (2003).
“Matsushita LightPix AE10”,NAiS Machine Vision—Matsushita Machine Vision Systems, (2003).
“Simatic Machine Vision”,Simatic VS 100 Series Siemens AG, www.siemens.com/machine-vision,(Apr. 1, 2003).
“SmartCapture Tool”,Feature Fact Sheet, Visionx Inc., www.visionxinc.com, (2003).
Asundi, A. , et al., “High-Speed TDI Imaging for Peripheral Inspection”,Proc. SPIEvol. 2423, Machine Vision Applications in Industrial Inspection III, Frederick Y. Wu; Stephen S. Wilson; Eds.,(Mar. 1995),189-194.
Baillard, C. , et al., “Automatic Reconstruction of Piecewise Planar Models from Multiple Views”,CVPR, vol. 02, No. 2,(1999),2559.
Baumberg, A. M. , et al., “Learning Flexible Models from Image Sequences”,University of Leeds, School of Computer Studies, Research Report Series, Report 93.36, (Oct. 1993),pp. 1-13.
Chang, Dingding , et al., “Feature Detection of Moving Images using a Hierarchical Relaxation Method”,IEICE Trans. Inf.&Syst., vol. E79-D, (Jul. 7, 1996).
Corke, Peter I., et al., “Real Time Industrial Machine Vision”,Electrical Engineering CongressSydney, Australia, CSIRO Division of Manufacturing Technology,(1994).
Demotte, Donald , “Visual Line Tracking”,Application Overview&Issues Machine Vision for Robot Guidance Workshop, (May 5, 2004).
Kim, Zuwhan , et al., “Automatic Description of Complex Buildings with Multiple Images”,IEEE0-7695-0813-8/00, (2000),155-162.
Marsh, R , et al., “The application of knowledge based vision to closed-loop control of the injection molding process”,SPIEvol. 3164, Faculty of Engineering University of the West of England United Kingdon,(1997),605-16.
Rohr, K. , “Incremental Recognition of Pedestrians from Image Sequences”,CVPR93, (1993).
West, Perry C., “High Speed, Real-Time Machine Vision”,Imagenation and Automated Vision Systems, Inc., (2001).
Wilson, Andrew , “CMOS/CCD sensors spot niche applications”,Vision Systems Design, (Jun. 2003).
Zarandy, Akos , et al., “Ultra-High Frame Rate Focal Plane Image Sensor and Processor”,IEEE Sensors Journal, vol. 2, No. 6,(2002).
Zarandy, A. , et al., “Vision Systems Based on the 128×128 Focal Plane Cellular Visual Microprocessor Chips”,IEEE, (Mar. 2003),III-518-III-521.
“ADSP-BF533 Blackfin Processor Hardware Reference”,Analog Devices Inc.—Media Platforms and Services Group, Preliminary Revision—Part No. 82-002005-01, (Mar. 2003).
“Blackfin Processor Instruction Set Reference”,Analog Devices, Inc., Revision 2.0, Part No. 82-000410-14,(May 2003).
“LM9630 100×128, 580 fps UltraSensitive Monochrome CMOS Image Sensor”,National Semiconductor Corp., www.national.com Rev. 1.0,(Jan. 2004).
“Cellular device processes at ultrafast speeds”,VisionSystems Design, (Feb. 2003).
“Cognex VisionPro”,Getting Started—QuickStart Tutorial, Cognex Corporation, 590-6560, Revision 3.5,(May 2004),69-94.
Haering, N. , et al., “Visual Event Detection”,Kluwer Academic Publishers, Chapter 2, Section 8,(2001).
IBM, “Software Controls for Automated Inspection Device Used to Check Interposer Buttons for Defects”,IP.com Journal, IP.com Inc., West Henrietts, NY, US, (Mar. 27, 2003).
Uno, T. , et al., “A Method of Real-Time Recognition of Moving Objects and its Application”,Pattern Recognition; Pergamon Press, vol. 8, pp. 201-208, (1976),pp. 201-208.
Shane C. Hunt, Mastering Microsoft PhotoDraw 2000, SYBEX, Inc., May 21, 1999.
Integrated Design Tools, High-Speed CMOS Digital Camera, X-Stream Vision User's Manual, 2000.
IO Industries, High Speed Digital Video Recording Software 4.0, IO industries, Inc.—Ontario, CA, 2002.
Phillip Kahn, Building Blocks for Computer Vision Systems, IEEE Expert, vol. 8, No. 6, XP002480004, pp. 40-50, Dec. 6, 1993.
Matrox, Interactive Windows Imaging Software for Industrial and Scientific Applications, Inspector 4.0—Matrox Imaging, pp. 8, Apr. 15, 2002.
Whelan, P. et al., Machine Vision Algorithms in Java, Chapter 1—An Introduction to Machine Vision, Springer-Verlag, XP002480005, 2001.
Cellular device processes at ultrafast speeds, VisionSystems Design, Feb. 2003.
Photron, USA, Product information for FASTCAM-X 1280 PCI, Copyright 2004, www.photron.com.
Photron, USA, Product information for FASTCAM PCI, Copyright 2004, www.photron.com.
Photron, USA, Product information for Ultima 1024, Copyright 2004, www.photron.co

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