Method for servicing an apparatus for capacitive...

Details Method for servicing an apparatus for capacitive... Method for servicing an apparatus for capacitive...

2008-01-18

2011-10-25

Valone, Thomas (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S658000, C324S663000

Reexamination Certificate

active

08044671

ABSTRACT:
A method for servicing, especially checking, an apparatus for capacitive ascertaining and/or monitoring at least one process variable of a medium, wherein the apparatus has at least one probe unit with a probe electrode and an auxiliary electrode. The probe electrode and/or the auxiliary electrode are/is supplied at least with one test signal or connected with at least one electrical potential, that at least one response signal is tapped from the probe unit, and that, at least from the response signal and a predeterminable desired value, information is obtained concerning the apparatus.

REFERENCES:
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patent: 4831325 (1989-05-01), Watson, Jr.
patent: 5396803 (1995-03-01), Ferran
patent: 6345537 (2002-02-01), Salamitou
patent: 6365888 (2002-04-01), Von Basse et al.
patent: 6476620 (2002-11-01), Kato et al.
patent: 7288945 (2007-10-01), Martinez et al.
patent: 2007/0032967 (2007-02-01), Feen et al.

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