Method for self regulating CMOS digital microcircuit burn-in wit

Electric heating – Heating devices – Combined with diverse-type art device

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324158F, G01R 3128, H05B 100

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052331610

ABSTRACT:
A burn-in heating circuit for an integrated circuit including a burn-in clock generator for producing a burn-in clock signal that is provided to the clock buffer of the clock distribution system of the integrated circuit. The operating frequency of the burn-in clock is at or close to the maximum frequency that the clock distribution system can reliably sustain with valid logic levels, so that the highest possible self-heating can be achieved by power dissipation in the clock distribution system. A comparator that is responsive to a temperature signal representative of the integrated circuit junction temperature and a signal indicative of the desired burn-in temperature modulates the clock generator so that the junction temperature of the integrated circuit resulting from self heating is close to the desired burn-in temperature.

REFERENCES:
patent: 3659199 (1972-04-01), Knutson
patent: 4497998 (1985-02-01), West
IBM Technical Disclosure Bulletin, vol. 25, No. 7B, Dec. 1982, "Self-Heating Test Chip for Reliability Life Test".
IBM Technical Disclosure Bulletin, vol. 14, No. 6, Nov. 1971, "Self-Contained Chip Heater".

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