Coded data generation or conversion – Analog to or from digital conversion – Differential encoder and/or decoder
Reexamination Certificate
2006-04-25
2006-04-25
Mis, David (Department: 2817)
Coded data generation or conversion
Analog to or from digital conversion
Differential encoder and/or decoder
C327S337000
Reexamination Certificate
active
07034725
ABSTRACT:
A method of self-calibrating a modulator includes at least one integrator likely to incur a phase error may include reading a pulse response of the modulator, calculating a phase error parameter of the at least one integrator, and calibrating the phase error parameter. In addition, the calibration may provide a count of pulse response samples above suitable threshold values, as well as a change in the value of a capacitor associated with the integrator based upon the sample count.
REFERENCES:
patent: 4718036 (1988-01-01), Halbert et al.
patent: 6172631 (2001-01-01), Tsai et al.
Fattaruso et al.,Self-Calibration Techniques for a Second-Order Multibit Sigma-Delta Modulator,IEEE International Sold State Circuits Conference, IEEE Inc., New York, vol. 36, Feb. 1993, pp. 228-229, 293, XP000388087.
Ueno et al.,An Oversampled Sigma-Delta A/D Converter Using Time Division Multiplexed Integrator,Circuits and Systems, 1990, Proceedings of the 33rdMidwest Symposium, Calgary, Alberta, Aug. 12-14, 1990, IEEE, Aug. 12, 1990, pp. 748-751, XP01004946.
Baschirotto Andrea
Colonna Vittorio
Gandolfi Gabriele
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Jorgenson Lisa K.
Mis David
STMicroelectronics S.r.l.
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