Method for selective deposition of refractory metals on silicon

Fishing – trapping – and vermin destroying

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437200, 437187, 437 40, 437 41, H01L 2144

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050844172

ABSTRACT:
Selective deposition of a refractory metal on a silicon substrate utilizing high temperature and a silane reduction process in which the flow rate ratio of silane to refractory metal halide gas is less than one. In a second embodiment, an additional layer of the refractory metal is deposited utilizing a hydrogen reduction of the metal halide gas at very high temperatures. In both embodiments, a refractory metal barrier layer may be provided by forming a self-aligned refractory metal silicide layer. Alternatively, a two layer self-aligned barrier is formed of a refractory metal silicide lower layer and a refractory metal nitride upper layer and the refractory metal is selectively deposited on the metal nitride.

REFERENCES:
patent: 3881242 (1975-05-01), Nuttall et al.
patent: 4565157 (1986-01-01), Brors et al.
patent: 4617087 (1986-10-01), Iyer et al.
patent: 4640004 (1987-02-01), Thomas et al.
patent: 4701349 (1987-10-01), Koyanagi et al.
"Comparision of Step Coverage and Other Aspects of the Hydrogen/Tungsten Hexafluoride and Silane/Tungsten Hexafluoride Reduction Schemes Used in Blanket LPCVD of Tungsten", Schmitz et al., Proc. of Electrochem. Soc. 1987, pp. 625-634.
"Tungsten Chemical Vapor Deposition Characteristics Using SiH.sub.4 in a Single Wafer System", Rosler et al., J. Vac. Sci. Technol. B6 (6), Nov./Dec. 1988, pp. 1721-1727.
"Refractory Metals and Metal Silicides for VLSI Devices", Chen. et al., Solid State Technol., Aug. 1984, pp. 145-149.
"Refractory Metals and Their Silicides in VLSI Fabrication", Wolf et al., Silicon Processing for the VLSI Era, 1986, pp. 384-406.
Kusumoto et al., "A New Approach to the Suppression of Tunneling", Tungsten and Other Refractory Metals for VLSI Applications III, Proceedings of the 1987 Workshop, MRS, pp. 103-109.
Surugo et al., "High Aspect Ratio Hole Filling by W CVD Combined With a Silicon Sidewall and Barrier Metal for Mitilevel Interconnection", J. Appl. Phys. 62(4), 1987.
Carlsson et al., "Thermodynamic Investigation of Selective, W CVD: Influence of Growth Conditions and Gas Additives on the Selectiveity in the Fluoride Process", Thin Solid Film 158 (1988).
Schulz, "Tin as a Diffusion Barrier Between CoSi.sub.2 or PtSi and Aluminum", Material Research Proceeding, 18, pp. 89-99, 1982.
A Highly Reliable Selective CVD-W Utilizing SiH.sub.4 Reduction for VLSI Contacts, H. Kotani et al., LSI Research and Development Laboratory, IEDM 87, pp. 217-220, 1987.
The Use of the TiSi.sub.2 in a Self-Aligned Silicide Technology, C. Y. Ting et al., IBM Thomas J. Watson Research Center, pp. 224-231.
Tungsten-On-Conducting Nitride Composite Films, K. Y. Ahn et al., IBM Technical Disclosure Bulletin, vol. 31, No. 3, pp. 477-478, 1988.
A Planar Metallization Process-Its Application To Tri-Level Aluminum Interconnection, T. Moriya et al., Toshiba Research and Development Center, IEDM 83, pp. 550-553, 1983.
WOS: Low Resistance Self-Aligned Source, Drain and Gate Transistors, P. A. Gargini et al., Intel Corp., IEDM 81, pp. 54-57, 1981.
Thin Layers of TiN and Al as Glue Layers for Blanket Tungsten Deposition, V. V. S. Rana et al., AT&T Bell Laboratories, pp. 187-195, 1987 Materials Research Society.
Selective CVD Tungsten Silicide for VLSI Applications, Takayuki Ohba et al., Fujitsu Limited, IEDM 87, pp. 213-216, 1987.
Underlayer for Polycide Process, K. Y. Ahn et al., IBM Technical Disclosure Bulletin, vol. 28, No. 9, pp. 3968-3969, 1986.
Selective Tungsten Silicide Deposition, S. A. Emma et al., IBM Technical Disclosure Bulletin, vol. 29, No. 5, p. 2195, 1986.
Cobalt Metallurgy for VLSI, S. S. Iyer and R. V. Joshi, IBM Technical Disclosure Bulletin, vol. 29, No. 5, p. 2197, 1986.

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