Method for selection of optical fiber and system for...

Details Method for selection of optical fiber and system for... Method for selection of optical fiber and system for...

2005-09-13

2005-09-13

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

06943872

ABSTRACT:
An optical fiber inspecting system1A comprises a waveform measuring unit2for measuring an OTDR waveform for an optical fiber F to be inspected and a waveform evaluating unit3for evaluating an anomaly within the optical fiber. The waveform evaluating unit3comprises a calculating part4and a detecting part5.The calculating part4calculates the gradient and the amount of change in gradient of the waveform at each time point. The detecting part5determines whether or not the gradient and the amount of change in gradient are within a defined allowable range of gradient and a defined allowable range of amount of change, respectively. This realizes an optical fiber inspecting system, an inspection method and a selecting method, all of which enable to detect reliably an anomaly within an optical fiber through an OTDR waveform.

REFERENCES:
patent: 5933227 (1999-08-01), Furuhashi
patent: 6229631 (2001-05-01), Sato et al.
patent: 6532103 (2003-03-01), Sakano et al.
patent: 9-269279 (1997-10-01), None
patent: 10-332530 (1998-12-01), None

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