Method for screening early failure of ceramic capacitor

Details Method for screening early failure of ceramic capacitor Method for screening early failure of ceramic capacitor

1994-08-16

1996-04-23

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324501, 324678, 324679, 209574, 320 1, G01R 3112

Patent

active

055107192

ABSTRACT:
A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic capacitor in a temperature around the maximum working temperature for a specific period of time with both terminals of each ceramic capacitor opened electrically; and eliminating defective capacitors whose residual voltage values are smaller than a specific voltage value.

REFERENCES:
patent: 3255409 (1966-06-01), Sztybel
patent: 3886447 (1975-05-01), Tanaka
patent: 3934195 (1976-01-01), Shires
patent: 4931721 (1990-06-01), Berrigan et al.
patent: 5101106 (1992-03-01), Cox et al.

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