Method for scattered radiation correction in the case of an...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Reexamination Certificate

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C378S009000

Reexamination Certificate

active

07443945

ABSTRACT:
It is proposed to estimate the scattered radiation on the basis of a sinogram, which is measured in any case. In at least one embodiment, a method includes determining the potential scattering site for each measuring beam from the object tangents in the sinogram and calculating the scattered intensity from the primary radiation striking the scattering site and the angle ratios of scattering beam, object tangent and measuring beam. Also proposed, in at least one embodiment, is an X-ray CT having at least bifocal detector systems and a control and computer unit for producing tomographic pictures, the control and arithmetic unit of which contains a program code that, upon being executed, carries out the method.

REFERENCES:
patent: 7039153 (2006-05-01), Bruder et al.
patent: 2006/0008046 (2006-01-01), Ruhrnschopf
patent: 2007/0253525 (2007-11-01), Popescu
patent: 103 02 567 (2004-08-01), None
patent: 10 2004 029 009 (2006-01-01), None

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