Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2005-10-25
2005-10-25
Toatley, Jr., Gregory J. (Department: 2877)
Optical: systems and elements
Compound lens system
Microscope
C356S317000, C250S339020
Reexamination Certificate
active
06958858
ABSTRACT:
A method for scanning microscopy is disclosed. It contains the step of generating an illuminating light beam that exhibits at least a first substantially continuous wavelength spectrum whose spectral width is greater than 5 nm; the choosing of a second wavelength spectrum that is arranged spectrally within the first wavelength spectrum; the step of selecting the light of the second wavelength spectrum out of the illuminating light beam using an acoustooptical component; and the step of illuminating a specimen with the illuminating light beam. A scanning microscope is also disclosed.
REFERENCES:
patent: 3720822 (1973-03-01), Rochester et al.
patent: 4367926 (1983-01-01), Hohki
patent: 4606641 (1986-08-01), Yamada et al.
patent: 4827125 (1989-05-01), Goldstein
patent: 4856893 (1989-08-01), Breen
patent: 4861158 (1989-08-01), Breen
patent: 4883963 (1989-11-01), Kemeny et al.
patent: 5043965 (1991-08-01), Iida et al.
patent: 5235452 (1993-08-01), Auffret et al.
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5410371 (1995-04-01), Lambert
patent: 5578818 (1996-11-01), Kain et al.
patent: 5680386 (1997-10-01), Le Carvennec et al.
patent: 6097870 (2000-08-01), Ranka et al.
patent: 6128077 (2000-10-01), Jovin et al.
patent: 6154310 (2000-11-01), Galvanauskas et al.
patent: 6292310 (2001-09-01), Chao
patent: 6300639 (2001-10-01), Wiederhoeft
patent: 6525812 (2003-02-01), Hartmann et al.
patent: 6567164 (2003-05-01), Birk et al.
patent: 6614525 (2003-09-01), Engelhardt et al.
patent: 2002/0006264 (2002-01-01), Birk et al.
patent: 2002/0009260 (2002-01-01), Birk et al.
patent: 2002/0018290 (2002-02-01), Birk et al.
patent: 2002/0028044 (2002-03-01), Birk et al.
patent: 2002/0043622 (2002-04-01), Birk et al.
patent: 2002/0050564 (2002-05-01), Birk et al.
patent: 2002/0018293 (2004-03-01), Birk et al.
patent: 4343490 (1995-06-01), None
patent: 19827140 (1999-12-01), None
patent: 19906757 (1999-12-01), None
patent: 19859314 (2000-01-01), None
patent: 19853669 (2000-11-01), None
patent: 19944355 (2001-03-01), None
patent: 9517662 (1995-06-01), None
patent: 0004613 (2000-01-01), None
T.A. Birks et al., “Supercontinuum Generation in Tapered Fibers”, vol. 25, No. 19 / Optics Letters, pp. 1415-1417, Oct. 1, 2000, Optical Society of America.
U.S. Appl. No. 09/881,062, filed Jun. 15, 2001, Birk et al., entitled “Arrangement for Examining Microscopic Preparations with a Scanning Microscope; and Illumination Device for a Scanning Microscope”.
Engelhardt Johann
Hoffmann Juergen
Davidson Davidson & Kappel LLC
Leica Microsystems Heidelberg GmbH
Nguyen Sang H.
Toatley , Jr. Gregory J.
LandOfFree
Method for scanning microscopy; and scanning microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for scanning microscopy; and scanning microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for scanning microscopy; and scanning microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3471742