Method for scanning a plurality of optical measuring reflectors

Details Method for scanning a plurality of optical measuring reflectors Method for scanning a plurality of optical measuring reflectors

1990-04-04

1991-09-17

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250225, 356364, G01N 2186

Patent

active

050497570

ABSTRACT:
A method for scanning a plurality of optical measuring reflectors adapted to reflect a scan beam in a position-related manner to a position detector, which supplies signals relating to the position of the beam incidence point in the detector plane. So far a separate scan beam has been generated for each measuring reflector and there has been a separate position detector for use therewith. In accordance with the invention a single common linearly polarized scan beam L1 and a single common detector D are provided and by turning the plane of polarization of the scan beam under electronic control and by the use of further optical means the scan beam is switched over as desired to a selected measuring reflector, which then reflects the incident scan beam to the common position detector D in position-related manner.

REFERENCES:
patent: 3981587 (1976-09-01), Gievers
patent: 4774405 (1988-09-01), Malin

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