Method for rewiring pads in a wafer-level package

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With peripheral feature due to separation of smaller...

Reexamination Certificate

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Details

C438S113000, C438S458000, C438S462000

Reexamination Certificate

active

06867479

ABSTRACT:
A method for rewiring contact pads in the wafer-level package is inventively provided. In order to be able to make the terminals of the characterization pads available for testing in a wafer-level package without these terminals being available later to the end user, the invention provides that the rewiring line is led via the scribe line of the wafer.

REFERENCES:
patent: 5696404 (1997-12-01), Murari et al.
patent: 5923047 (1999-07-01), Chia et al.
patent: 06 151 535 (1994-05-01), None
patent: 10 050 780 (1998-02-01), None
patent: 10 125 745 (1998-05-01), None
patent: 11 330 176 (1999-11-01), None

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