Method for retesting semiconductor device

Details Method for retesting semiconductor device Method for retesting semiconductor device

2006-09-19

2006-09-19

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07109740

ABSTRACT:
A method for re-testing semiconductor device includes following processes: (1) providing a first carrier for accommodating semiconductor devices which have been tested; (2) taking the semiconductor devices out from the first carrier and placing them according to the information of a fist map by a pick-and-place machine, wherein the information of the first map has the coordinates of the positions of the film frame where the semiconductor is to be placed; (3) placing the film frame with the semiconductor devices placed thereon to a testing machine, and re-testing the semiconductor devices according to the information of the first map by the tester; (4) placing the film frame with the semiconductor devices attached thereon to a pick-and-place machine, and taking the semiconductor devices out according to the result of the retesting from the film frame, and placing the semiconductor devices on at least one carriers.

REFERENCES:
patent: 6066822 (2000-05-01), Nemoto et al.
patent: 6518745 (2003-02-01), Kim et al.

Affiliated with

Also associated with

Rating

Method for retesting semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for retesting semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for retesting semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3609108