Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Reexamination Certificate
2005-09-27
2005-09-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
C324S339000
Reexamination Certificate
active
06950749
ABSTRACT:
A method is disclosed for real-time (well-site) resistivity anisotropy determination using array lateral logs or any other unfocused, lateral-type measurements, and array induction logs or any other focused, induction-type measurements. Near-vertical wells with a deviation angle of less than 30 degrees are considered. Since with a lateral log, at each logging depth the injected current has both horizontal and vertical components, the data contains information related to both horizontal (Rh) and vertical (Rv) resistivities. With array induction tool, the induced current in near-vertical wells has only a horizontal component, and the induction data contain information related to Rhonly. Having those two data sets acquired in the same well, it is possible to instantly estimate the formation resistivity anisotropy using square of a ratio between borehole and invasion corrected lateral and induction focused logs.
REFERENCES:
patent: 3697864 (1972-10-01), Runge
patent: 3808520 (1974-04-01), Runge
patent: 4319192 (1982-03-01), Chemali et al.
patent: 5452761 (1995-09-01), Beard et al.
patent: 5870690 (1999-02-01), Frenkel et al.
patent: 5883515 (1999-03-01), Strack et al.
patent: 5889729 (1999-03-01), Frenkel et al.
patent: 5966013 (1999-10-01), Hagiwara
patent: 6060885 (2000-05-01), Tabarovsky et al.
patent: 6219619 (2001-04-01), Xiao et al.
patent: 6308136 (2001-10-01), Tabarovsky et al.
patent: 6381542 (2002-04-01), Zhang et al.
patent: 6385545 (2002-05-01), Wu
patent: 6442488 (2002-08-01), Xiao et al.
patent: 6591194 (2003-07-01), Yu et al.
patent: 6618676 (2003-09-01), Kriegshauser et al.
patent: 6636045 (2003-10-01), Tabarovsky et al.
patent: 6760666 (2004-07-01), Hagiwara
patent: 2368915 (2002-05-01), None
patent: WO95/03557 (1995-02-01), None
Yang, Determining Resistivity Anisotropy by Joint Lateral and Induction Logs, Jun. 17-20, 2001, SPWLA 42nd Annual Logging Symposium.
Watson et al., Differentiating Anisotropy and Lateral Effects Using Azimuthal Resistivity Offset Wenner Soundings, May-Jun. 1999, Geophysics, vol. 64, No. 3, pp. 739-745.
Bonner et al., Resistivity While Drilling- Images from the String, Spring 1996, Oilfield Review, pp. 4-19.
Wei Yang,Determining Resistivity Anisotropy By Joint Lateral and Induction Logs, SPWLA 42nd Annual Logging Symposium, Jun. 17-20, 2001, pp. 1-5, 10 Figs.
K.S. Kunz et al.;Some Effects of Formation Anisotropy on Resistivity Measurements in Boreholes, Geophysics, V. 34, No. 4, Oct. pp. 770-794, 10 Figs.
Michael A. Frenkel et al.;Real-time Estimation of Resistivity Anisotropy Using Array Lateral and Induction Logs, OTC 15125, 2003 Offshore Technology Conference, Houston, Texas, May 5-8, 2003, pp. 1-6, 2 Figs.
Victor Rosato et al.;Real Time Interpretation of MWD Anisotropy in High Angle Wells, Offshore Gulf of Mexico, SPWLA 38th Annual Logging Symposium, Jun. 15-18, 1997, pp. 1-6, 8 Figs., 1 Table.
T. Hagiwara et al.;Identifying and Quantifying Resistivity Anisotropy in Vertical Boreholes, SPWLA 40th Annual Logging Symposium, May 30-Jun. 3, 1999, pp. 1-11, 13 Figs.,1 Table.
R. Griffiths et al.;Optimal Evaluation of Formation Resistivities Using Array Induction and Array Laterolog Tools, SPWLA 41st Annual Logging Symposium, Jun. 4-7, 2000, pp. 1-13, 23 Figs.
Frenkel Michael A.
Geldmacher Ingo M.
Baker Hughes Incorporated
Barlow John
Le Toan M.
Madan Mossman & Sriram P.C.
LandOfFree
Method for resistivity anisotropy determination in near... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for resistivity anisotropy determination in near..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for resistivity anisotropy determination in near... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3396000