Method for removing spin-on-glass at wafer edge

Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...

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134 26, 134 32, 134 33, 134 254, 134 38, 134 42, B08B 308

Patent

active

059139790

ABSTRACT:
The present invention provides a method for removing unwanted coating layer at wafer edge by first immersing the wafer edge in a cleaning solution and then immersing in a rinsing solution such as deionized water to remove the residual cleaning solution from the surface of the wafer. The wafer can be dried in a subsequent spin dry process.

REFERENCES:
patent: 5451291 (1995-09-01), Park et al.
patent: 5454970 (1995-10-01), Flaningam et al.
patent: 5643818 (1997-07-01), Sachdev et al.
patent: 5688411 (1997-11-01), Kutsuzawa et al.

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