Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...
Patent
1997-01-08
1999-06-22
El-Arini, Zeinab
Cleaning and liquid contact with solids
Processes
For metallic, siliceous, or calcareous basework, including...
134 26, 134 32, 134 33, 134 254, 134 38, 134 42, B08B 308
Patent
active
059139790
ABSTRACT:
The present invention provides a method for removing unwanted coating layer at wafer edge by first immersing the wafer edge in a cleaning solution and then immersing in a rinsing solution such as deionized water to remove the residual cleaning solution from the surface of the wafer. The wafer can be dried in a subsequent spin dry process.
REFERENCES:
patent: 5451291 (1995-09-01), Park et al.
patent: 5454970 (1995-10-01), Flaningam et al.
patent: 5643818 (1997-07-01), Sachdev et al.
patent: 5688411 (1997-11-01), Kutsuzawa et al.
Lin Hui-Tzu
Shen Chih-Heng
El-Arini Zeinab
Taiwan Semiconductor Manufacturing Co. Ltd
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