Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-01-25
2005-01-25
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S689000, C438S695000
Reexamination Certificate
active
06846748
ABSTRACT:
A method for removing photoresist is described. A substrate having a photoresist to be removed thereon is provided, and then an ashing process is performed to remove most of the photoresist. The substrate is irradiated with UV light, and the remaining photoresist and polymer are stripped with stripping solvents after UV irradiation.
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Chien Wen-Sheng
Hsieh Yen-Wu
J.C. Patents
Le Thao P.
Nelms David
United Microeletronics Corp.
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