Method for removing copper contaminant from semiconductor surfac

Adhesive bonding and miscellaneous chemical manufacture – Methods – Surface bonding and/or assembly therefor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

134 2, 134 42, 427 82, 427309, 427444, 252 791, 252 795, B44D 512, H01L 700

Patent

active

039517101

ABSTRACT:
Copper contaminants are removed from silicon with a solution containing copper (II) complexes. The solution may be recycled after use by bubbling oxygen through it.

REFERENCES:
patent: 2647830 (1953-08-01), Allen et al.
patent: 2961354 (1960-11-01), Cleveland
patent: 3413160 (1968-11-01), Teumac
patent: 3436259 (1969-04-01), Regh
patent: 3447965 (1969-06-01), Teumac
patent: 3549433 (1970-12-01), Renner
patent: 3600244 (1971-08-01), Wegener
Chem. Abstracts, Vol. 79, (Aug. 1973), p. 311, No. 47100d, Copper Ammonia Complex Etching Solution. . . Alloys.
Copper Ammonia Complex Etching Solution...Alloys."

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for removing copper contaminant from semiconductor surfac does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for removing copper contaminant from semiconductor surfac, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for removing copper contaminant from semiconductor surfac will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1584932

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.