Semiconductor device manufacturing: process – Making point contact device
Patent
1996-05-23
1998-05-26
Kight, John
Semiconductor device manufacturing: process
Making point contact device
438663, H05K 100, H05K 103
Patent
active
057563764
ABSTRACT:
A method for removing a diffusion barrier layer on pad regions and diminishing the effect of plasma ions induced when removing a photoresist layer by a plasma asher. A two stage rapid thermal processing step is applied to the partially-removed diffusion barrier layer before a metal layer is formed. The first stage lasts a longer period of time at a lower temperature, for example, in the range of between 50 and 60 seconds at a temperature of about 600.degree. C. The second stage lasts a shorter period of time at a higher temperature, for example, in the range of between 20 and 30 seconds at a temperature of about 750.degree. C.
REFERENCES:
patent: 4307132 (1981-12-01), Chu et al.
patent: 4702967 (1987-10-01), Black et al.
patent: 4753851 (1988-06-01), Roberts et al.
Chung Chen-Hui
Sheng Yi-Chung
Su Kuan-Cheng
Kight John
United Microelectronics Corporation
White Everett
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