Pulse or digital communications – Testing – Phase error or phase jitter
Reexamination Certificate
2007-09-27
2011-12-06
Tse, Young T. (Department: 2611)
Pulse or digital communications
Testing
Phase error or phase jitter
C375S371000, C713S503000
Reexamination Certificate
active
08073043
ABSTRACT:
A method and a corresponding system for characterizing the performance of a clock and data recovery circuit in a digital transceiver is presented. The method comprises phase modulating a jitter-free data signal by a testing signal having added data jitter and measuring the time the clock and data recovery system takes to achieve bit lock of a phase modulated signal. Data uncorrelated timing jitter corresponding to a user defined probability distribution is included in the jitter testing signal. Utilization of a variable probability distribution in generating data uncorrelated timing jitter, as provided by the present invention, allows for greater flexibility and accuracy in clock and data recovery circuit testing and characterization.
REFERENCES:
patent: 6735160 (2004-05-01), Miyashita et al.
patent: 7388937 (2008-06-01), Rodger et al.
patent: 2006/0100801 (2006-05-01), Tabatabaei et al.
patent: 2006/0291548 (2006-12-01), Mattes et al.
patent: 2010/0026314 (2010-02-01), Schuttert
Liu Xin
Xin Jiang Li
Zhang Liang
Haynes and Boone LLP
Integrated Device Technology Inc.
Tse Young T.
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