Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1987-05-21
1989-03-28
Smith, Jerry
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
2504922, 324158T, G01R 3126
Patent
active
048167533
ABSTRACT:
A method for reliability testing of wafer stage integrated circuit devices wherein a hardness factor is established relating device substrate currents to device lifetimes attributable to interface trap degradation. A beam of ionizing radiation is then directed onto the device until a critical dose is reached, at which time the device fails. The critical dose is plotted against hardness factors so that device lifetimes may be predicted.
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Advanced Research and Applications Corporation
Baker Stephen M.
Schneck Thomas
Smith Jerry
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