Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1985-04-12
1987-03-31
LaRoche, Eugene R.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 250225, G01B 902, G02F 101
Patent
active
046539158
ABSTRACT:
A passive device for reducing polarization fading in interferometers with significantly degrading the signal-to-noise ratio. In one embodiment, light from an interferometer output is passed through a lens to a polarization mask. The polarization mask comprises at least three distinct polarizers which pass distinct states of polarization. After passing through the polarizers each independently polarized signal is detected, demodulated and passed to a means for signal extraction.
REFERENCES:
patent: 3932039 (1976-01-01), Frey
patent: 4558952 (1985-12-01), Kulesh et al.
Dandridge Anthony
Frigo Nicholas J.
Tveten Alan B.
LaRoche Eugene R.
Mis David
Sheinbein Sol
The United States of America as represented by the Secretary of
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