X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Reexamination Certificate
2008-05-13
2008-05-13
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Electronic circuit
With display or signaling
C378S098900
Reexamination Certificate
active
07372943
ABSTRACT:
In recording projection images for dual absorptiometry, the optical thickness of an object being examined is determined on the basis of a projection image recorded in a high-energy range, and parameters for recording a projection image in the low-energy range are selected as a function of the determined optical thickness. The ratio between image quality and the radiation dosage of the object being examined can be optimized thereby.
REFERENCES:
patent: 5648997 (1997-07-01), Chao
patent: 6343111 (2002-01-01), Avinash et al.
patent: 2002/0075997 (2002-06-01), Unger et al.
Siemens Aktiengesellschaft
Thomas Courtney
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