Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-10-17
2006-10-17
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C342S022000
Reexamination Certificate
active
07124044
ABSTRACT:
A method is disclosed for reconstructing complex wave attributes from limited view measurements of a scattering object. The method involves the analytic continuation of the Fourier transform of the object function into the area in which there is an absence of K-space coverage by requiring objects to be an even function. (It is assumed that physical objects are even functions, and it is this assumption that allows analytic continuation.) When the object function is not centered at the origin, the measurements are shifted to the origin prior to determining the analytic continuation and returned to their original location following analytic continuation.
REFERENCES:
Search Report issued Mar. 15, 2006 for International Application PCT/US04/24058, filed Jul. 28, 2004.
Written Opinion issued Mar. 15, 2006 for International Application PCT/US04/24058, filed Jul. 28, 2004.
Assouad Patrick J.
Fulbright & Jaworski L.L.P.
LandOfFree
Method for reconstructing complex wave attributes from... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for reconstructing complex wave attributes from..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for reconstructing complex wave attributes from... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3677041