Method for reading multiple-value memory cells

Static information storage and retrieval – Floating gate – Multiple values

Reexamination Certificate

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C365S185180, C365S185190, C365S185220, C365S185230, C365S185240

Reexamination Certificate

active

07460397

ABSTRACT:
A read method for multiple-value information in a semiconductor memory such as a nonvolatile semiconductor memory is introduced. The method includes obtaining a first data from a selected multiple-value memory cell by applying a first voltage to a control gate of the selected multiple-value memory cell. A second data from the selected multiple-value memory cell is obtained by applying a second voltage to the control gate of the selected multiple-value memory cell. A first bit of the plurality of bits stored in the selected multiple-value memory cell is then obtained by performing a predetermined calculation on the first data and the second data. A second bit of the plurality of bits is obtained from the selected multiple-value memory cell by applying a third voltage to the control gate of the selected multiple-value memory cell.

REFERENCES:
patent: 5621682 (1997-04-01), Tanzawa et al.
patent: 5870218 (1999-02-01), Yyouno et al.
patent: 6026014 (2000-02-01), Sato et al.
patent: 6038165 (2000-03-01), Miwa et al.
patent: 6222763 (2001-04-01), Sato et al.
patent: 6301150 (2001-10-01), Kanamitsu et al.
patent: 6771537 (2004-08-01), Jyouno et al.

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