Optics: measuring and testing – Document pattern analysis or verification
Patent
1984-11-15
1987-01-13
McGraw, Vincent P.
Optics: measuring and testing
Document pattern analysis or verification
356376, 358111, G01B 1124, H04N 308
Patent
active
046360697
ABSTRACT:
A method for reading deformation images recorded on electrophotographic media involving scanning of an image surface and measuring microscopic surface tilt in a reflected beam. In one embodiment, the deformation image is scanned telecentrically and in another embodiment the surface is scanned with a beam at angles to the surface. By intercepting the retroflected beam and measuring the deviation of the reflected beam from the scanning center, a number of proportional-to-surface tilt is found. By then electrically integrating over neighboring regions, an electrical or optical pattern, reimaging the deformation image, may be constructed.
REFERENCES:
patent: 4336998 (1982-06-01), Ruell
patent: 4398787 (1983-08-01), Balasubramanian
patent: 4521808 (1985-06-01), Ong et al.
Brochure, "Model 1000B-Automated Wavefront Measurement System", by Digital Optics Corporation, 1030D East Duane Ave., Sunnyvale, CA 94086.
Matrix Instruments Inc.
McGraw Vincent P.
Schneck Thomas
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