Method for radiological examination of an object

Details Method for radiological examination of an object Method for radiological examination of an object

2006-11-07

2006-11-07

Ho, Allen C. (Department: 2882)

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

C378S005000, C378S018000, C378S053000

Reexamination Certificate

active

07133494

ABSTRACT:
The invention relates to a method for x-ray examination of an object where two categories of materials are taken into consideration, comprising: the use of broad spectrum x-rays; measurements of the x-rays by bands of the spectrum; expressions ({circumflex over (M)}) of thicknesses or masses of the two categories of materials passed through by the x-rays, the expressions ({circumflex over (M)}) being functions of at least two of the measurements (mesk) and coefficients (A); and applying a selection criterion from among the expressions ({circumflex over (M)}) to deduce from this an expression (final {circumflex over (M)}) considered true; characterized in that the selection criterion comprises a combination (f) of the expressions with weighting factors (a), and a calculation of the weighting factors such that the combination has minimal variation according to variations of the measurements.

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