Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-02-12
2009-06-23
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S754120, C356S432000, C428S336000, C702S057000
Reexamination Certificate
active
07552018
ABSTRACT:
The present invention provides a baseline function, viz., a transmission-related parameter (transmission loss, transmission coefficient, etc.) as a function of resistance of a uniformly resistant finitely thin film—which is predicated on the theoretical behavior of electromagnetic radiation passing through a uniformly resistant infinitely thin film. This theoretical behavior is characterized by constancy of the transmission-related parameter for any frequency of the electromagnetic radiation, wherein each resistance value has associated therewith a constant transmission-related parameter. The baseline function is formed by calculating the constant transmission-related parameter value for each of plural resistance values in the theoretical model. The baseline function is correlated with an empirical function, viz., a transmission-related parameter as a function of frequency of the electromagnetic radiation—which is formed, in empirical testing, by measuring the transmission-related parameter value for each of plural resistance values. The correlation yields a functional relationship between resistance and frequency.
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Jones Wayne C.
Lazarus Aaron D.
Kaiser Howard
Le John H
The United States of America as represented by the Secretary of
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