Method for pushing a contact probe against object to be...

Details Method for pushing a contact probe against object to be... Method for pushing a contact probe against object to be...

2006-06-26

2008-12-09

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07463045

ABSTRACT:
A contact probe includes a probe tip and a damper. The probe tip includes a first barrel, a probe pin, and a first spring. The first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel. The probe pin is mounted in the first barrel so as to be movable forward and backward. The first spring is mounted in the cavity for elastically biasing the probe pin towards the opening. The damper is mounted to the second end of the first barrel, and elastically supports the first barrel.

REFERENCES:
patent: 3584300 (1971-06-01), Schulz et al.
patent: 3904960 (1975-09-01), Niehaus
patent: 4004843 (1977-01-01), Boenning et al.
patent: 4490593 (1984-12-01), Cook
patent: 4659987 (1987-04-01), Coe et al.
patent: 4889483 (1989-12-01), Gentry
patent: 4918384 (1990-04-01), Giringer et al.
patent: 4926119 (1990-05-01), Prokopp
patent: 4959609 (1990-09-01), Prokopp et al.
patent: 5029038 (1991-07-01), Covi et al.
patent: 5084673 (1992-01-01), Kazama
patent: 5124646 (1992-06-01), Shiraishi
patent: 5189364 (1993-02-01), Kazama
patent: 2004/0246014 (2004-12-01), Goto
patent: 0 233 756 (1987-08-01), None
patent: 290182 (1988-11-01), None
patent: 06317607 (1994-11-01), None
patent: 07012846 (1995-01-01), None
patent: 09-072932 (1997-03-01), None
patent: 09072932 (1997-03-01), None
patent: 2001-201515 (2001-07-01), None
Search Report dated Oct. 10, 2006 for corresponding European Patent Application No. 04 252 061.9.

Affiliated with

Also associated with

Rating

Method for pushing a contact probe against object to be... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for pushing a contact probe against object to be..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for pushing a contact probe against object to be... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4044219