Method for providing a probe for a probe-microscopic...

Details Method for providing a probe for a probe-microscopic... Method for providing a probe for a probe-microscopic...

2011-06-28

2011-06-28

Wells, Nikita (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Scanning or positioning arrangements, i.e., arrangements for...

C850S005000, C850S033000, C850S040000, C073S105000, C073S866500, C250S306000

Reexamination Certificate

active

07971266

ABSTRACT:
The present invention relates to a method for providing a measuring probe (1, 1a,2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which has a probe base (1a) and a probe extension (2) formed thereon, is held on a carrier device and the measuring probe (1) is processed before or after a measurement by detaching a section of the probe extension (2). The invention further relates to an arrangement having a probe microscope for the probe microscopic examination of a sample, in particular a scanning probe microscope.

REFERENCES:
patent: 5331275 (1994-07-01), Ozaki et al.
patent: 6730905 (2004-05-01), Nakagawa et al.
patent: 7022985 (2006-04-01), Knebel et al.
patent: 7473894 (2009-01-01), Knebel et al.
patent: 2009/0178165 (2009-07-01), Shile
patent: 2010/0218284 (2010-08-01), Jahnke

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