Method for programming an electronically programmable...

Static information storage and retrieval – Read only systems – Fusible

Reexamination Certificate

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C365S225700

Reexamination Certificate

active

07345904

ABSTRACT:
A method for programming an electronically programmable semiconductor fuse applies a programming current to a fuse link as a series of multiple pulses. The fuse link has a nominal maximum programming current and corresponding combinations of a programming voltage and a gate voltage associated with the nominal maximum programming current. A first programming current pulse is generated to provide a programming current less than the maximum programming current. The first programming current pulse causes electromigration to increase the resistance of the fuse link. A subsequent programming current pulse is applied using a combination of gate voltage and programming voltages which if applied to the fuse link absent any electromigration would result in a programming current greater than the nominal maximum programming current. However, the resistance created by the first programming pulse reduces the programming current of the subsequent programming pulse to a level below the maximum programming current.

REFERENCES:
patent: 6624499 (2003-09-01), Kothandaraman et al.
patent: 2005/0189613 (2005-09-01), Otsuka et al.
patent: 2005/0237841 (2005-10-01), Wu et al.
patent: 2005/0286332 (2005-12-01), Uvieghara
patent: 2006/0044049 (2006-03-01), Ouellette et al.
patent: 2006/0087001 (2006-04-01), Kothandaraman et al.
patent: 2006/0108662 (2006-05-01), Kothandaraman et al.
C. Kothandaraman, et al., “Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides”, Sep. 2002, IEEE Electron Device Letters, vol. 23 No. 9, pp. 523-525.
J.R. Lloyd, “Electromigration for Designers: An Introduction for Non-Specialist”, http://wwww.techonline.com/community/ed—resource/feature—article/20421, 10 pages, Apr. 12, 2002.

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