Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Patent
1997-04-04
2000-12-05
Speer, Timothy
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
438406, 438753, 438977, 428446, 428450, 428702, H01L 21306
Patent
active
061566241
ABSTRACT:
This invention solves the problem of a pasted SOI substrate generating voids in the peripheral part thereof and consequently decreasing the number of devices to be derived therefrom. It concerns a method for the production of a SOI substrate obtained by pasting a first Si substrate possessing a SiO.sub.2 surface and a second substrate possessing a Si surface on the SiO.sub.2 surface and the Si surface, which method comprises washing the Si surface of the second Si substrate, thereby imparting hydrophobicity to the Si surface before the first Si substrate and the second Si substrate are pasted together.
REFERENCES:
patent: 5250460 (1993-10-01), Yamagata et al.
patent: 5405802 (1995-04-01), Yamagata et al.
patent: 5498893 (1996-03-01), Usui et al.
patent: 5523254 (1996-06-01), Satoh et al.
patent: 5523602 (1996-06-01), Horiuchi et al.
patent: 5580797 (1996-12-01), Miwa et al.
patent: 5616507 (1997-04-01), Nakai et al.
patent: 5670411 (1997-09-01), Yonehara et al.
patent: 5679475 (1997-10-01), Yamagata et al.
patent: 5691231 (1997-11-01), Kobayashi et al.
patent: 5695557 (1997-12-01), Yamagata et al.
patent: 5705421 (1998-01-01), Matsushita et al.
Patent Abstracts of Japan, vol. 16, No. 297 (E-1226), Jun. 30, 1992 (corresponding to JP 4-79209).
Patent Abstracts of Japan, vol. 016, No. 516 (P-1443), Oct. 23, 1992 (JP 04-190385).
Patent Abstracts of Japan, vol. 008, No. 202 (P-300), Sep. 14, 1984 (JP 59-087481).
Patent Abstract of Japan, vol. 016, No. 402 (P-1409), Aug. 25, 1992 (JP 04-133087).
Patent Abstracts of Japan, vol. 008, No. 129 (P-280), Jun. 15, 1984 (JP 59-031990).
Patent Abstracts of Japan, vol. 015, No. 266 (P-1223), Jul. 5, 1991 (JP 03-087895).
Patent Abstracts of Japan, vol. 016, No. 586 (P-1463), Dec. 25, 1992 (JP 04-234066).
Patent Abstracts of Japan, vol. 016, No. 502 (P-1438), Oct. 16, 1992 (JP 04-182684).
Patent Abstracts of Japan, vol. 017, No. 611 (P-1641), Nov. 10, 1993 (JP 05-188796).
Patent Abstracts of Japan, vol. 015, No. 420 (P-1267), Oct. 24, 1991 (JP 03-171188).
Patent Abstracts of Japan, vol. 016, No. 297 (E-1226), Jun. 30, 1992 (JP 04-079209).
Patent Abstracts of Japan, vol. 017, No. 295 (E-1377), Jun. 7, 1993 (JP 05-021765).
Patent Abstracts of Japan, vol. 017, No. 653 (E-1469), Dec. 3, 1993 (JP 05-217822).
T. Abe, "Silicon Wafer Bonding Mechanism for Silicon-On-Insulator Structures", Jap. J. of App. Phys., vol. 29, No. 12, part 2, Dec. 1, 1990.
N. Sato, "High-Quality Epitaxial Layer Transfer (Eltran) By bond and Etch-Back of Porous Si", 1995 IEEE Intl. SOI Conf. Proc., Tucson, Oct. 3-5, 1995.
H. Ohashi, "Improved Dielectrically Isolated Device Integration By Silicon-Wafer Direct Bonding (SDB) Technique", IEDM, Tech. Dig., Los Angeles, Dec. 7-10, 1986.
Proceedings of 4th International Symposium an Silicon-On-Insulator Technology and Devices, May 6-11, 1990, T. Abe et al., "Silicon Wafer-Bonding Process Technology for SOI Structures".
Japanese Journal of Applied Physics, vol. 30, No. 4, Apr., 1991, pp. 615-622, K. Mitani et al., "Causes and Prevention of Temperature-Dependent Bubbles in Silicon Wafer Bonding".
Atoji Tadashi
Sakaguchi Kiyofumi
Yamagata Kenji
Yonehara Takao
Canon Kabushiki Kaisha
Speer Timothy
Stein Stephen
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