Method for producing test program for semiconductor device

Details Method for producing test program for semiconductor device Method for producing test program for semiconductor device

1997-06-12

1999-05-04

Beausoliel, Jr., Robert W.

Excavating

364488, G06F 1100

Patent

active

059011548

ABSTRACT:
The invention relates to a method for reducing the time required to test the functions of a semiconductor device. Test modules, each having a plurality of test statements, are created for testing predetermined functions of the device. Common test statements are extracted from the test modules. A test program is then produced by sequentially arranging the extracted statement(s) and the remaining statements from the test modules.

REFERENCES:
patent: 5235271 (1993-08-01), Kira
patent: 5282146 (1994-01-01), Aihara et al.
patent: 5581491 (1996-12-01), Biwer et al.
patent: 5629878 (1997-05-01), Kobrosly
patent: 5729676 (1998-03-01), Inoue
patent: 5754755 (1998-05-01), Smith, Jr.
patent: 5761408 (1998-06-01), Kolawa et al.

Affiliated with

Also associated with

Rating

Method for producing test program for semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing test program for semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing test program for semiconductor device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1875339