Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2006-05-16
2006-05-16
Rodriguez, Paul L. (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S016000, C702S117000, C714S724000, C714S738000, C714S739000, C714S726000
Reexamination Certificate
active
07047174
ABSTRACT:
A test pattern generation flow has a stimulus and a device under test (DUT) that operate together through a test bench. The test bench monitors and collects all the data necessary to generate a test program. This information is presented as a captured simulation that allows for ease of generating test software, as well as other simulations such as fault simulation and virtual test simulation. The complete and convenient information can be utilized to automate the development and/or easily manually develop and debug the test software.
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Carlin Alan Joseph
Carson, Jr. Hubert Glenn
Koh Alex S. Y.
Tumin Kenneth Paul
Chiu Joanna G.
Clingan, Jr. James L.
Freescale Semiconductor Inc.
Rodriguez Paul L.
Thangavelu Kandasamy
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