Method for producing single crystal silicon carbide

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Liquid phase epitaxial growth

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C117S011000, C117S063000, C117S951000

Reexamination Certificate

active

07637998

ABSTRACT:
Single crystal SiC, having no fine grain boundaries, a micropipe defect density of 1/cm2or less and a crystal terrace of 10 micrometer or more is obtained by a high-temperature liquid phase growth method using a very thin Si melt layer. The method does not require temperature difference control between the growing crystal surface and a raw material supply polycrystal and preparation of a doped single crystal SiC is possible.

REFERENCES:
patent: 3527626 (1970-09-01), Brander
patent: 4582561 (1986-04-01), Ioku et al.
patent: 5679153 (1997-10-01), Dmitriev et al.
patent: 5719409 (1998-02-01), Singh et al.
patent: 5895526 (1999-04-01), Kitoh et al.
patent: 6153166 (2000-11-01), Tanino
patent: 2004/0266057 (2004-12-01), Nagasawa
patent: 0 926 271 (1999-06-01), None
patent: 0 967 304 (1999-12-01), None
patent: 1 215 730 (2002-06-01), None
patent: 1 243 674 (2002-09-01), None
patent: 1 249 521 (2002-10-01), None
patent: 11-315000 (1999-11-01), None
patent: 2001-158695 (2001-06-01), None
patent: 2002-047100 (2002-02-01), None
patent: 3541789 (2004-04-01), None
Michael Shur et al., “SiC Materials And Devices”, vol. 2, World Scientific, Selected Topics in Electronics and Systems—vol. 43, pp. 1-27.
Adrian Powell et al., “Growth of SiC Substrates”, World Scientific, International Journal of High Speed Electronics and Systems, vol. 16, No. 3 (2006) 751-777, pp. 1-27.
International Conference Silicon Carbide and Related Materials 2007 (ICSCRM2007), “100 mm 4H-SiC Wafers with Zero Micropipe Density, and low 1c-screw Dislocation Density”.
Nakamura et al., Nature, “Ultrahigh-quality silicon carbide single crystals”, vol. 430, Aug. 26, 2004, pp. 1009-1012.
Ha et al., Journal of Crystal Growth 244 (2002) pp. 257-266, “Dislocation conversion in 4H silicon carbide epitaxy”.
R. Yakimova, et al., “Current Status and Advances in the Growth of Sic”, Diamond and Related Materials, Elsevier Science Publishers, Amsterdam, NL, vol. 9, No. 3-6, Apr. 2000, pp. 432-438.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for producing single crystal silicon carbide does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing single crystal silicon carbide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing single crystal silicon carbide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4145018

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.