Semiconductor device manufacturing: process – Semiconductor substrate dicing – With attachment to temporary support or carrier
Reexamination Certificate
2008-10-07
2011-12-06
Wagner, Jenny L (Department: 2891)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
With attachment to temporary support or carrier
C257SE25016
Reexamination Certificate
active
08071465
ABSTRACT:
A method for producing a semiconductor chip with an adhesive film, which includes: preparing a laminate in which a semiconductor wafer, an adhesive film and a dicing tape are laminated in that order, the adhesive film having a thickness in the range of 1 to 15 μm and a tensile elongation at break of less than 5%, and the tensile elongation at break being less than 110% of the elongation at a maximum load, and the semiconductor wafer having a section, for dividing the semiconductor wafer into a plurality of semiconductor chips, which is formed by irradiating with laser light; dividing the semiconductor wafer into a plurality of semiconductor chips without dividing the adhesive film, by expanding the dicing tape; and dividing the adhesive film by picking up the plurality of semiconductor chips.
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Chinese Official Action dated Jul. 18, 2011, for CN Application No. 200880110812.4.
Hatakeyama Keiichi
Nakamura Yuuki
Antonelli, Terry Stout & Kraus, LLP.
Hitachi Chemical Company Ltd.
Wagner Jenny L
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