Method for producing self-aligned mask, articles produced by...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S759000, C257SE21232, C257SE21035

Reexamination Certificate

active

07378738

ABSTRACT:
A method for forming a self-aligned pattern on an existing pattern on a substrate comprising applying a coating of a solution containing a masking material in a carrier, the masking material being either photo or thermally sensitive; performing a blanket exposure of the substrate; and allowing at least a portion of the masking material to preferential develop in a fashion that is replicates the existing pattern of the substrate. The existing pattern may be comprised of a first set of regions of the substrate having a first reflectivity and a second set of regions of the substrate having a second reflectivity different from the first composition. The first set of regions may include one or more metal elements and the second set of regions may include a dielectric. Structures made in accordance with the method.

REFERENCES:
patent: 6448655 (2002-09-01), Babich et al.
patent: 6583043 (2003-06-01), Shroff et al.
patent: 6777807 (2004-08-01), Lu et al.
patent: 2002/0187625 (2002-12-01), Shimooka et al.

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