Method for producing nuclear traces or microholes originating fr

X-ray or gamma ray systems or devices – Beam control – Shutter or chopper

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328233, H01J 2300

Patent

active

043693709

ABSTRACT:
Method for producing nuclear traces, or microholes originating from nuclear traces, from a single ion or a countable number of ions in a solid body by means of an accelerator, e.g. heavy ions in a heavy ion accelerator. A widened or attenuated beam or ions is directed onto the surface of a solid body via a preliminary aperture to cut out any non-required particles. The impinging of an individual particle, after or before passage through the solid body, is determined directly and depending of this determination, other particles which might possibly pass through the aperture are prevented from doing so.

REFERENCES:
patent: 3725797 (1973-04-01), Masuda
patent: 4229704 (1980-10-01), Lewis
"Unilac, The Accelerator Facility for Heavy Ions of the GSI", Kerntechnik 19, Jahrgang, (1977), No. 2, Angert et al.

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