Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With a step of measuring – testing – or sensing
Reexamination Certificate
2007-11-13
2007-11-13
Smith, Duane (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With a step of measuring, testing, or sensing
C117S088000, C117S089000, C117S090000, C117S952000, C117S056000, C438S093000, C438S479000, C438S481000, C257S013000, C257S094000, C257S096000, C257S097000, C257S098000, C257S103000, C257S184000
Reexamination Certificate
active
10396831
ABSTRACT:
A method for producing a nitride semiconductor crystal comprising steps (a), (b) and (c), which steps follow in sequence as follows: a step (a) for forming fine crystal particles made of a nitride semiconductor on a substrate; a step (b) for forming a nitride semiconductor island structure having a plurality of facets inclined relative to a surface of the substrate using the fine crystal particles as nuclei; and a step (c) for causing the nitride semiconductor island structure to grow in a direction parallel with a surface of the substrate to merge a plurality of the nitride semiconductor island structures with each other, thereby forming a nitride semiconductor crystal layer having a flat surface; the steps (a)-(c) being continuously conducted in the same growing apparatus.
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Fujikura Hajime
Iizuka Kazuyuki
Hitachi Cable Ltd.
Rao G. Nagesh
Smith Duane
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