Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2007-06-18
2010-12-14
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C257SE21546, C438S424000, C438S430000
Reexamination Certificate
active
07851326
ABSTRACT:
A method for producing deep trench structures in an STI structure of a semiconductor substrate is provided, with the following successive process steps: subsequent to a full-area filling of STI recesses introduced into a semiconductor substrate with a first filler material, a first surface of a semiconductor structure is subjected to a CMP process to level the applied filler material and produce the STI structure; the leveled STI structure thus produced is structured; using the structured, leveled STI structure as a hard mask, at least one deep trench is etched in the area of this STI structure to create the deep trench structures.
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Dietz Franz
Dudek Volker
Graf Michael
Hoffmann Thomas
Landau Matthew C
McCall-Shepard Sonya D
Muncy Geissler Olds & Lowe, PLLC
TELEFUNKEN Semiconductors GmbH & Co. KG
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