Method for producing an optoelectronic semiconductor chip,...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S041000, C438S606000, C257S103000, C257SE21110

Reexamination Certificate

active

07981712

ABSTRACT:
A method for producing an optoelectronic semiconductor chip based on a nitride semiconductor system is specified. The method comprises the steps of: forming a semiconductor section with at least one p-doped region; and forming a covering layer disposed downstream of the semiconductor section in a growth direction of the semiconductor chip, said covering layer having at least one n-doped semiconductor layer. An activation step suitable for electrically activating the p-doped region is effected before or during the formation of the covering layer. An optoelectronic semiconductor chip which can be produced by the method is additionally specified.

REFERENCES:
patent: 5834326 (1998-11-01), Miyachi et al.
patent: 6020602 (2000-02-01), Sugawara et al.
patent: 6526082 (2003-02-01), Corzine et al.
patent: 2002/0025661 (2002-02-01), Nikolaev et al.
patent: 2003/0085409 (2003-05-01), Shen et al.
patent: 2005/0173724 (2005-08-01), Liu
patent: 2005/0199904 (2005-09-01), Yamamoto
patent: 2005/0221520 (2005-10-01), Ou et al.
patent: 2005/0221526 (2005-10-01), Cho et al.
patent: 2006/0054917 (2006-03-01), Lee et al.
patent: 2006/0220057 (2006-10-01), Shim et al.
patent: 2007/0096143 (2007-05-01), Kim et al.
patent: 10 2005 035 722 (2007-02-01), None
patent: 0 541 373 (1992-11-01), None
patent: 1 755 173 (2006-08-01), None
patent: 2000-315858 (2000-11-01), None
patent: WO 2006/074916 (2006-07-01), None
V. Kirilyuk et al., “Photoluminescence study of homoepitaxial N-polar GaN grown on differently misoriented single crystal substrates”, Journal of Crystal Growth, vol. 230, pp. 477-480, 2001.
G. Martinez et al., “Study of inversion domain pyramids formed during the GaN:Mg growth”, Solid-State Electronics, vol. 47, pp. 565-568, 2003.
P.R. Tavernier et al., “The growth of N-face GaN by MOCVD: effect of Mg, Si, and In”, Journal of Crystal Growth, vol. 264, pp. 150-158, 2004.
J.L. Weyher et al., “Morphological and structural characteristics of homoepitaxial GaN grown by metalorganic chemical vapour deposition (MOCVD)”, Journal of Crystal Growth, vol. 204, pp. 419-428, 1999.
A.R.A. Zauner et al., “Homo-epitaxial growth on the N-face of GaN single crystals: the influence of the misorientation on the surface morphology”, Journal of Crystal Growth, vol. 240, pp. 14-21, 2002.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for producing an optoelectronic semiconductor chip,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing an optoelectronic semiconductor chip,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing an optoelectronic semiconductor chip,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2664739

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.