Method for producing a standard pattern for pattern matching

Details Method for producing a standard pattern for pattern matching Method for producing a standard pattern for pattern matching

1985-09-19

1988-11-08

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 14, 382 27, G06K 900

Patent

active

047838310

ABSTRACT:
This invention provides a method and apparatus for automatically producing a standard pattern for local pattern matching. According to the present invention, local patterns equivalent in size to a standard pattern to be obtained are successively removed from the image of an object being examined to prepare standard pattern candidates. Evaluation values representing appropriateness as a standard pattern are obtained from the local patterns successively removed or the local patterns together with the image of the object being examined. The evaluation values are used in an evaluation function expressing the uniqueness of the standard pattern and in an auxiliary evaluation function as an aid to the former. The standard pattern is selected using such evaluation values.

REFERENCES:
patent: 3541511 (1970-11-01), Genchi et al.
patent: 4021778 (1977-05-01), Ueda et al.
patent: 4091394 (1978-05-01), Kashioka et al.
patent: 4429414 (1984-01-01), Asakawa
patent: 4435835 (1984-03-01), Sakow et al.
patent: 4441205 (1984-04-01), Berkin et al.

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