Method for producing a silicon single crystal and a silicon...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth

Reexamination Certificate

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C117S011000, C117S013000, C117S021000, C117S928000, C117S931000, C117S932000

Reexamination Certificate

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07909930

ABSTRACT:
A method for producing a silicon single crystal by the Czochralski method with carbon-doping comprising: charging a polycrystalline silicon material and any one of a carbon dopant selected from the group consisting of an organic compound, an organic compound and a silicon wafer, carbon powder and a silicon wafer, an organic compound and carbon powder, and an organic compound and carbon powder and a silicon wafer into a crucible and melting the polycrystalline silicon material and the carbon dopant; and then growing a silicon single crystal from the melt of the polycrystalline silicon material and the carbon dopant. And a carbon-doped silicon single crystal produced by the method. Thereby, there is provided a method for producing a silicon single crystal with carbon-doping in which the crystal can be doped with carbon easily at low cost, and carbon concentration in the crystal can be controlled precisely.

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European Search Report issued in corresponding European Application No. 05 72 7712, forwarded Dec. 11, 2009.
Official Communication in European Patent Application No. 05 727 712.1 mailed Jun. 28, 2010.
European Office Action mailed Dec, 27, 2010 in related European Patent Application No. 05 727 712.1.

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