Method for producing a semiconductor including a foreign...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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C438S044000, C438S226000, C438S245000, C438S269000, C438S357000, C438S360000, C438S388000, C438S413000, C438S416000, C438S424000, C438S695000, C438S699000, C438S700000, C257SE29012, C257SE21257, C257SE21546, C257SE21548, C257SE21564

Reexamination Certificate

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07947569

ABSTRACT:
A method for producing a semiconductor including a material layer. In one embodiment a trench is produced having two opposite sidewalls and a bottom, in a semiconductor body. A foreign material layer is produced on a first one of the two sidewalls of the trench. The trench is filled by epitaxially depositing a semiconductor material onto the second one of the two sidewalls and the bottom of the trench.

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