Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2011-05-24
2011-05-24
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S044000, C438S226000, C438S245000, C438S269000, C438S357000, C438S360000, C438S388000, C438S413000, C438S416000, C438S424000, C438S695000, C438S699000, C438S700000, C257SE29012, C257SE21257, C257SE21546, C257SE21548, C257SE21564
Reexamination Certificate
active
07947569
ABSTRACT:
A method for producing a semiconductor including a material layer. In one embodiment a trench is produced having two opposite sidewalls and a bottom, in a semiconductor body. A foreign material layer is produced on a first one of the two sidewalls of the trench. The trench is filled by epitaxially depositing a semiconductor material onto the second one of the two sidewalls and the bottom of the trench.
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Berger Rudolf
Foerg Raimund
Lehnert Wolfgang
Mauder Anton
Pfirsch Frank
Abdelaziez Yasser A
Dicke Billig & Czaja, PLLC
Garber Charles D
Infineon Technologies Austria AG
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