Method for producing a semiconductor device having semiconductor

Fishing – trapping – and vermin destroying

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437 26, 437100, H01L 2122, H01L 2174

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057054061

ABSTRACT:
A method for producing a semiconductor device having semiconductor layers of SiC with at least three doped layers on top of each other, comprises the steps of growing a first semiconductor layer of SiC; implanting an impurity dopant into the first layer to form a second doped surface layer as a sub-layer therein, the second doped surface layer being surrounded, except for the top surface thereof, by the first semiconductor layer; and epitaxially growing a third semiconductor layer of SiC on top of the second layer of SiC and regions of the first layer adjacent thereto to totally bury the second semiconductor layer. The impurity dopant implanted into the first semiconductor layer is of a first conductivity n or p type, and the first semiconductor layer being doped with a second, opposite conductivity type, so as to form a pn-junction at the interface between the first and second layers.

REFERENCES:
patent: 4775882 (1988-10-01), Miller et al.
patent: 5030580 (1991-07-01), Furukawa et al.
patent: 5135885 (1992-08-01), Furukawa et al.
patent: 5270554 (1993-12-01), Palmour
patent: 5322802 (1994-06-01), Baliga et al.
patent: 5378642 (1995-01-01), Brown et al.
patent: 5510281 (1996-04-01), Ghezzo et al.
Sonntag et al., Ion-Implantation Doping of Crystalline 6H-SiC, Applied PhysicsA 61, pp. 363-367, Springer-Verlag 1995.
Vodakov et al., Diffusion and Solubility of Impurities in Silicon Carbide, Intern. Conf. on Silicon Carbide, University of South Carolina, 1973.
Rao et al., P-N Junction Formation in 6H-SiC by Acceptor Implantation into N-type Substrate, Nuclear Instruments and Methods in Physics Research B 106, 1995, pp. 333-338.
Rao et al., A1 and B Ion-Implantations in 6H- and 3C-SiC, J. Appl. Phys. 77 (6) Mar. 1995, pp. 2479-2485.
Ahmed et al., Boron and Aluminim Implantation in .alpha.-SiC, Appl. phys. Lett. 65 (1), Jul. 1994, pp. 67-69.
Ghezzo et al, Nitrogen-Implanted SiC Diodes Using High-Temperature Implantation, IEEE Electron Device Letters, vol. 13, No. 12, Dec. 1992, pp. 639-641.
Shenoy et al., Planar, Ion Implanted, High Voltage 6H-SiC P-N Junction Diodes, IEEE Electron Device Letters, vol. 16, No. 10, Oct. 1995, pp. 454-456.
Kalinina et al., Electrical Properties of P-N Junctions Formed By Ion Implantation In N-Type SiC, Sov. Phys. Semicond. 12 (12), Dec. 1978, pp. 1372-1374.
Ghezzo et al., Boron-Implanted 6H-SiC Diodes, Appl. Phys. Lett. 63 (9), Aug. 1993, pp. 1206-1208.
Planson et al., Evaluation of 6H-SiC Mesa N.sup.+ P Junction Breakdown Voltage, Proceedings of the First International Power Electronics and Motion Control Conference, IPEMC'94, Bejing, 1994 International Academic Publishers, pp. 142-145.
Addamiano et al., Ion Implantation Effects of Nitrogen, Boron, and Aluminum in Hexagonal Silicon Carbide, Journal of the Electrochemical Society, Solid-State Science and Technology, 1972, pp. 1355-1361.
Rao et al., A1, A1/C and A1/Si Implantations in 6H-SiC, Journal of Electronic Materials, vol. 25, No. 1, 1996, pp. 75-80.

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