Semiconductor device manufacturing: process – Forming schottky junction
Reexamination Certificate
2005-05-24
2005-05-24
Pert, Evan (Department: 2829)
Semiconductor device manufacturing: process
Forming schottky junction
C438S092000, C438S169000, C438S931000
Reexamination Certificate
active
06897133
ABSTRACT:
The invention concerns a method for making a vertical Schottky diode on a highly doped N-type silicon carbide substrate (1), comprising steps which consist in forming an N-type lightly doped epitaxial layer (2); etching out a peripheral trench at the active zone of the diode; forming a type P doped epitaxial layer; carrying out a planarization process so that a ring (6) of the P type epitaxial layer remains in the trench; forming an insulating layer (3) on the outer periphery of the component, said insulating layer partly covering said ring; and depositing a metal (4) capable of forming a Schottky barrier with the N type epitaxial layer.
REFERENCES:
patent: 3575731 (1971-04-01), Hoshi et al.
patent: 3891479 (1975-06-01), Zwernemann
patent: 4636269 (1987-01-01), Boland
patent: 5696025 (1997-12-01), Violette et al.
patent: 5917204 (1999-06-01), Bhatnagar et al.
patent: 5917228 (1999-06-01), Matsuda et al.
patent: 6091108 (2000-07-01), Harris et al.
patent: 6693308 (2004-02-01), Sankin et al.
patent: 0380340 (1990-01-01), None
International Search Report from corresponding PCT application No. PCT/FR01/03379, filed Oct. 30, 2001.
Patent Abstracts of Japan vol. 002, No. 051 (E-026), Apr. 12, 1978 & JP 53 014579.
Jorgenson Lisa K.
Morris James H.
Pert Evan
Sarkar Asok Kumar
STMicroelectronics S.A.
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