Etching a substrate: processes – Forming or treating an article whose final configuration has...
Reexamination Certificate
2006-07-11
2006-07-11
Ahmed, Shamim (Department: 1765)
Etching a substrate: processes
Forming or treating an article whose final configuration has...
C216S066000, C438S712000, C427S585000, C250S234000, C250S306000, C250S307000, C073S105000
Reexamination Certificate
active
07074340
ABSTRACT:
A method of producing a device for simultaneously carrying out an electrochemical and a topographical near field microscopy is disclosed, which is characterized in that a probe suitable for topographic near field microscopy is covered by a conductive material, the conductive material is covered by an insulating layer, and the conductive material and the insulating layer are removed in the region of the immediate tip of the probe.
REFERENCES:
patent: 5838005 (1998-11-01), Majumdar et al.
patent: 5936237 (1999-08-01), Van der Weide
patent: 5936243 (1999-08-01), Gibson et al.
patent: 5965218 (1999-10-01), Bothra et al.
patent: 5969238 (1999-10-01), Fischer
patent: 6034348 (2000-03-01), Kim et al.
patent: 6703614 (2004-03-01), Stifter et al.
patent: 6894272 (2005-05-01), Kranz et al.
Bard et al., “Chemical imaging of surfaces with the scanning electrochemical microscope,”Science, 254:68-74, 1991.
Borgwarth et al., “Scanning electrochemical microscopy: a new scanning mode based on convective effects,”Berichte Der Bunsen-Gesellschaft—Physical Chemistry Chemical Physics, 98:1317, 1994.
Bottomley, “Scanning probe microscopy,”Anal. Chem, 70:452R-475R, 1998.
James et al., “Scanning electrochemical microscopy with simultaneous independent topography,”J. Electrochem. Soc.,145(4):L64-L66, 1998.
Ludwig et al., “Topography feedback mechanism for the scanning electrochemical microscope based on hydrodynamic forces between tip and sample,”Rev. Sci. Instrum., 66(4):2857-2860, 1995.
Macpherson and Unwin, “Combined scanning electrochemical—atomic force microscopy,”Anal. Chem., 72:276-285, 2000.
Matsui and Ochiai, “Focused ion beam applications to solid state devices,”Nanotechnology, 7:247-258, 1996.
Wipf and Bard, “Scanning electrochemical microscopy. 15. Improvements in imaging via tip-position modulation and lock-in detection,”Anal. Chem., 64: 1362-1367, 1992.
Bertagnolli Emmerich
Kranz Christine
Lugstein Alois
Mizaikoff Boris
Ahmed Shamim
Fulbright & Jaworski L.L.P.
Innovationsagentur Gesellschaft
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