Method for producing a device for simultaneously carrying...

Etching a substrate: processes – Forming or treating an article whose final configuration has...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S066000, C438S712000, C427S585000, C250S234000, C250S306000, C250S307000, C073S105000

Reexamination Certificate

active

07074340

ABSTRACT:
A method of producing a device for simultaneously carrying out an electrochemical and a topographical near field microscopy is disclosed, which is characterized in that a probe suitable for topographic near field microscopy is covered by a conductive material, the conductive material is covered by an insulating layer, and the conductive material and the insulating layer are removed in the region of the immediate tip of the probe.

REFERENCES:
patent: 5838005 (1998-11-01), Majumdar et al.
patent: 5936237 (1999-08-01), Van der Weide
patent: 5936243 (1999-08-01), Gibson et al.
patent: 5965218 (1999-10-01), Bothra et al.
patent: 5969238 (1999-10-01), Fischer
patent: 6034348 (2000-03-01), Kim et al.
patent: 6703614 (2004-03-01), Stifter et al.
patent: 6894272 (2005-05-01), Kranz et al.
Bard et al., “Chemical imaging of surfaces with the scanning electrochemical microscope,”Science, 254:68-74, 1991.
Borgwarth et al., “Scanning electrochemical microscopy: a new scanning mode based on convective effects,”Berichte Der Bunsen-Gesellschaft—Physical Chemistry Chemical Physics, 98:1317, 1994.
Bottomley, “Scanning probe microscopy,”Anal. Chem, 70:452R-475R, 1998.
James et al., “Scanning electrochemical microscopy with simultaneous independent topography,”J. Electrochem. Soc.,145(4):L64-L66, 1998.
Ludwig et al., “Topography feedback mechanism for the scanning electrochemical microscope based on hydrodynamic forces between tip and sample,”Rev. Sci. Instrum., 66(4):2857-2860, 1995.
Macpherson and Unwin, “Combined scanning electrochemical—atomic force microscopy,”Anal. Chem., 72:276-285, 2000.
Matsui and Ochiai, “Focused ion beam applications to solid state devices,”Nanotechnology, 7:247-258, 1996.
Wipf and Bard, “Scanning electrochemical microscopy. 15. Improvements in imaging via tip-position modulation and lock-in detection,”Anal. Chem., 64: 1362-1367, 1992.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for producing a device for simultaneously carrying... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for producing a device for simultaneously carrying..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing a device for simultaneously carrying... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3581743

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.