METHOD FOR PROCESSING DATA REPRESENTING PARAMETERS RELATING...

Details METHOD FOR PROCESSING DATA REPRESENTING PARAMETERS RELATING... METHOD FOR PROCESSING DATA REPRESENTING PARAMETERS RELATING...

2005-05-24

2005-05-24

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S120000, C702S182000

Reexamination Certificate

active

06898546

ABSTRACT:
A method for processing first data representing parameters relating to several components of an electrical circuit provides an associated first data record for each component. The components of the circuit are checked against specific parameters. The parameters relate to the connection of the components to networks, or to electrical/geometric characteristics of the components. The check of the “basic rules” results in the formation of binary values. The binary values are then logically linked to check an “overall rule”. One such overall rule is, for example, the rule for checking the circuit for adequate electrostatic discharge (ESD) protection. A computer readable storage medium and a data processing system, each containing computer-executable instructions for performing the method, are provided.

REFERENCES:
patent: 5561784 (1996-10-01), Chen et al.
patent: 5842224 (1998-11-01), Fenner
patent: 5860136 (1999-01-01), Fenner

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