Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-01-24
2006-01-24
Bali, Vikkram (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C382S146000, C382S148000, C382S149000
Reexamination Certificate
active
06990227
ABSTRACT:
This invention discloses a method for printed circuit board (PCB) inspection, including providing a multiplicity of PCBs placed on an inspection panel, defining each non-identical PCB in terms of geometry and features which are to be inspected, grouping the PCBs into at least one cluster, the at least one cluster being defined in terms of an amount, location and orientation of the PCBs in the at least one cluster, creating a reference image for the panel defined by a location and orientation of the at least one cluster on the panel and inspecting the panel by comparing sensed information with the reference image.
REFERENCES:
patent: 4778745 (1988-10-01), Leung
patent: 5495535 (1996-02-01), Smilansky et al.
patent: 6111602 (2000-08-01), Kim
patent: 6437862 (2002-08-01), Miyazaki et al.
patent: 6483937 (2002-11-01), Samuels
Barel Michael
Greenberg Anat
Gutarts Gregory
Nadivi Jacob
Yaari Anna
Bali Vikkram
Ladas & Parry LLP
Orbotech LTD
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