Method for preparing and evaluating measurement specificatons fo

Details Method for preparing and evaluating measurement specificatons fo Method for preparing and evaluating measurement specificatons fo

1989-03-22

1991-05-28

Gruber, Felix D.

Boots, shoes, and leggings

364489, 371 27, G01R 3128

Patent

active

050200100

ABSTRACT:
A method of preparing measurement specifications is used in measuring the properties of an electronic circuit by means of a test facility which includes a measurement apparatus which operates in accordance with a measurement program including measurement specifications. The method includes the steps of preparing an overall testing peripheral circuit, an interface between the overall testing peripheral circuit and the measurement apparatus, and a measurement specification for each measurement item based on input signals, switch settings, and input/output signal paths of the overall testing peripheral circuit, activating the measurement apparatus in accordance with the measurement program to produce results for each measurement item, and correcting measurement specifications based on the result of the measurement and the measurement program.

REFERENCES:
patent: 4070565 (1978-01-01), Borrelli
patent: 4622647 (1986-11-01), Sagnard et al.
patent: 4656632 (1987-04-01), Jackson
patent: 4764925 (1988-08-01), Grimes et al.

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