Method for predicting capacitance of connection nets on an integ

Details Method for predicting capacitance of connection nets on an integ Method for predicting capacitance of connection nets on an integ

1993-07-09

1994-03-15

Harvey, Jack B.

Boots, shoes, and leggings

364488, 364490, G06F 1560

Patent

active

052950883

ABSTRACT:
A method estimates the interconnect capacitance of a first net in an integrated circuit. The first step of the method includes the generation of a value which indicates how tightly connected to one another are components connected to the first net. The second step of the method includes the prediction of interconnect capacitance of the first net based on the value generated in the first step and a number representing how many components are connected to the first net.

REFERENCES:
patent: 4763289 (1988-08-01), Barzilai et al.
patent: 4815024 (1989-03-01), Lewis
patent: 5107320 (1992-04-01), Iranmanesh
Kortekaas; "On-Chip Quasi-static Floating-gate Capacitance Measurement Method"; IEEE Conf on Microelectronics; Mar. 1990.

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