Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2005-06-21
2005-06-21
Assouad, Patrick (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S182000, C702S183000, C702S184000, C702S185000, C073S602000, C073S610000, C451S005000, C451S008000
Reexamination Certificate
active
06909988
ABSTRACT:
A process for positioning at least one defect in a billet being forged into an article is described. The size and location of the billet is first determined, using a non-destructive test such as ultrasonic inspection. The movement of the defect under selected forging conditions is then predicted, using a finite element analysis model. The billet can then be positioned and forged under conditions which cause the defect to move to a non-critical area of the article. In this manner, a billet which might otherwise be discarded or set aside can often be retained for a useful purpose. Related articles are also described.
REFERENCES:
patent: 3657638 (1972-04-01), Holler et al.
patent: 3693074 (1972-09-01), Holler et al.
patent: 3825821 (1974-07-01), Forster
patent: 4004454 (1977-01-01), Matay
patent: 4112626 (1978-09-01), Watanabe et al.
patent: 4247819 (1981-01-01), Shimada et al.
patent: 4258319 (1981-03-01), Shimada et al.
patent: RE31355 (1983-08-01), Rozmus
patent: 4458155 (1984-07-01), Gruner et al.
patent: 4537073 (1985-08-01), Ooshiro et al.
patent: 4541011 (1985-09-01), Mayer et al.
patent: 4562349 (1985-12-01), Stumm
patent: 4633620 (1987-01-01), Lorenzi et al.
patent: 4673124 (1987-06-01), Conolly
patent: 4762679 (1988-08-01), Gegel et al.
patent: 4912664 (1990-03-01), Weiss et al.
patent: 5106012 (1992-04-01), Hyzak et al.
patent: 5167157 (1992-12-01), Wertz et al.
patent: 5377116 (1994-12-01), Wayne et al.
patent: 5475797 (1995-12-01), Glaspy et al.
patent: 5533401 (1996-07-01), Gilmore
patent: 5569860 (1996-10-01), Aizawa et al.
patent: 5629865 (1997-05-01), Roth
patent: 5915277 (1999-06-01), Patton
patent: 6035243 (2000-03-01), Galuga et al.
Batzinger Thomas James
Bewlay Bernard Patrick
Gigliotti, Jr. Michael Francis Xavier
Srivatsa Shesh Krishna
Assouad Patrick
Clarke Penny A.
Patnode Patrick K.
Tsai Carol S. W.
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